Suitable for power factor regulator (PFC) testing (600V, 1200V models)
4 battery discharge modes: CC+CV battery discharge test mode； CP+CV battery discharge test mode；CC+ UVP battery discharge test mode and CP+ UVP battery discharge test mode.
Automated OCP, OPP test functions and 150 sets of parameter storage function.
Optional interface: GPIB, RS232, USB, LAN
GWINSTEK
GWINSTEK AEL-5000 AC/DC Load
CC, Linear CC, CR, CV, CP and AC Rectifier Load Mode
Frequency Range : DC, 40~440Hz
Turbo Mode for 2 Times the Current and Power of Electronic Load within 1 Second
Three Units Parallel up to 90kW and Three-phase △ or Y Load Connection Can be Synchronized Control by One Master Unit
Positive Half-cycle or Negative Half-cycle Loading
Optional Interface : GPIB、RS232、USB、LAN
GWINSTEK
GWINSTEK PEL-5000G Series High Power DC Electronic Load
5 digital V / A / W Meter can be displayed on Large LCD display simultaneously
Flexible CC, CR, CV, CP, CV + CL, CV + PL, Dynamic and short circuit operation modes
Master-slave control is up to 1 Master and 7 Slaves
Optional Interface: GPIB, RS232, USB, LAN
SEQ Load Mode’s programmable function allows for ultra-high-speed step changes from 0.02 to 999000 ms in CC or CP mode
KEYSIGHT
KEYSIGHT E4991B Impedance Analyzer
Basic Accuracy: 0.65%
Frequency: 3 GHz
Measurement: RF-IV method
Measurements: Capacitance
DC Bias: 0 V to ±40 V, 0 A to ±100 mA
Maximum Frequency: 3 GHz
Measurement Range(Accuracy < 10%): 120 mΩ to 52 kΩ
Target DUT: General Purpose device Material
KEYSIGHT
KEYSIGHT N8974B Noise Figure Analyzer
Bandwidth:8 MHz
Gain Uncertainty: ±0.15 dB
Frequency Range: 10 MHz to 7 GHz
Speed: 18.3 ms/measurement
Measurement Functions: Noise Figure, Noise Factor, Y-Factor, Gain
KEYSIGHT
Keysight B1506A
B1506A common features
Wide operation range up to 3 kV/1500 A
Fully automated fast thermal test from -50 °C to +250 °C
Automatic power device (semiconductor and component) datasheet creation
Auto record function to prevent data loss
B1506A IV package features
Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both package and on-wafer devices
Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing actual device performance
Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed waveforms for accurate measurement
Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A, 1500 A
B1506A full package features
All of the IV package features
Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) at 3kV for package devices
Gate charge (Qg) curve measurement for package devices
Power loss (conduction, driving and switching loss) calculation
B1506A IV Package
B1506A-H20 20 A / 3 kV IV measurement
B1506A-H50 500 A / 3 kV IV measurement
B1506A-H70 1500 A / 3 kV IV measurement
B1506A Full Package
B1506A-H21 20 A / 3 kV IV, C-V and Gate charge measurement
B1506A-H51 500 A / 3 kV IV, C-V and Gate charge measurement
B1506A-H71 1500 A / 3 kV IV, C-V and Gate charge measurement
KEYSIGHT
Keysight B1505A
Precision measurement across a wide range of operating conditions
All-in-one solution for power device characterization up to 1500 A & 10 kV
Medium current measurement with high voltage bias (e.g. 500 mA at 1200 V)
μΩ on-resistance measurement capability
Accurate, sub-picoamp level, current measurement at high voltage bias
Fully automated thermal testing from -50 ℃ to +250 ℃
Extensive device evaluation capabilities
Fully automated Capacitance (Ciss, Coss, Crss, etc.) measurement at up to 3000 V of DC bias
High power pulsed measurements down to 10 μs
Both packaged device and on-wafer IGBT/FET gate charge measurement
High voltage/high current fast switch option to characterize GaN current collapse effect
Up to five high voltage (3 kV) source/measure channels for maximum flexibility
Safe temperature dependent testing via an interlock-equipped test fixture
Improved measurement efficiency
Switch between high-voltage and high-current measurements without the need to recable
Automatic test circuit formation for transistor junction capacitances (Ciss, Coss, Crss, Cgs, Cgd, Cds, etc.) for both packaged and on-wafer devices
Standard test fixtures with interlock for safe packaged power device testing
Supported and secure on-wafer high-power testing over 200 A and up to 10 kV
The oscilloscope view allows verification of applied voltage and current waveforms
MS Windows-based EasyEXPERT software facilitates data management and analysis
Upgradable and scalable hardware architecture
A wide selection of measurement modules
Support for high-power devices with up to 6 pins
Keysight B1505AP
Configurations for power device testing
Selection of eight options, (configurations) for a variety of power device testing
Modules / expanders for future upgrade
Wide sourcing range combined with low-level precision measurement
All-in-one solution for power device characterization up to 1500 A & 10 kV
μΩ resistance measurement capability
Accurate sub-picoamp level current measurement at high voltage bias
Extensive device evaluation capabilities
Capacitance measurement up to +/-3 kV DC bias
10μs high power pulse measurements
Temperature measurement capability
Improved measurement efficiency
Automatically switch between high-voltage and high-current measurements without recabling
Standard test fixtures with interlock for safe packaged power device testing
Oscilloscope view for monitoring waveform applied to the device
MS Windows-based EasyEXPERT software simplifies data management and data analysis
KEYSIGHT
Keysight B1500
Access Multiple Measurement Instruments in One Semiconductor Device Analyzer for all Your Semiconductor Testing Needs
Switch between CV and IV measurements without re-cabling
Capture ultra-fast transient phenomena not possible with other conventional test instruments
Detect multi-frequency AC capacitance measurements from a range of 1 kHz to 5 MHz
Analyze data without an external PC using the intuitive 15-inch touch screen interface
Configure the B1500A with your choice of measurement modules, up to 10 slots in a box
Enjoy the 15-inch wide touch screen with intuitive EasyEXPERT group+ software
Current versus voltage (IV) measurement
Accurate and precise measurement ranges of 0.1 fA – 1 A and 0.5 μV – 200 V
Spot and sweep measurement
Time sampling measurements (100 μs minimum sampling rate)
Pulsed measurement with minimum pulse widths of 50 μs using the MCSMU or 500 μs using the HPSMU, MPSMU, or HRSMU
The ASU (atto-sense and switch unit) can be used with the MPSMU, or HRSMU to provide 0.1 fA measurement resolution and SMU/AUX path switching
Two analog-to-digital converter choices (high-resolution ADC or high-speed ADC) available for each SMU type (HPSMU, MPSMU and HRSMU)
Capacitance measurement
Multi-frequency AC impedance measurement supports CV (capacitance versus voltage), C-t (capacitance versus time) and C-f (capacitance versus frequency) measurement
Capacitance measurement frequency range of 1 kHz to 5 MHz
Quasi-Static Capacitance-Voltage (QS-CV) measurement with leakage current compensation
Automated switching between IV and CV measurements using either the optional SCUU (SMU CMU unify unit) and GSWU (guard switch unit) or a pair of ASUs
Pulsed IV/Fast IV/Transient IV measurement
Provides high speed and high sensitivity measurement capability for ultra-fast IV (current-voltage), pulsed IV and transient IV measurements, including NBTI/PBTI and RTN (Random Telegraph Signal Noise) measurements
Arbitrary waveform generation with 10 ns programmable resolution
Simultaneous high-speed voltage/current measurement (200 MSa/s, 5 ns sampling rate) SMU technology supports pulsed IV measurement without load line effects
Pulse generation
Up to ±40 V voltage pulsing and arbitrary waveform generation for non-volatile memory evaluation
Single channel two-level and three level pulsing capability
B1500A platform
15-inch touch screen supports all capabilities of the intuitive GUI for convenient device characterization
Configurable and upgradable measurement modules with 10 slots per mainframe
GPIB, USB, LAN interfaces, and VGA video output port
Standards: PCIe 4.0, USB 3.2, SATA 6G, SAS 24G, DP, SD-UHS II, TBT, MIPI, DDR5, PON, 64G FC, 10/40/100 GbE, OIF-CEI-26G
Link Training: PCIe, USB, SATA, SAS, 10GBASE, 25GBASE
KEYSIGHT
KEYSIGHT N1914B EPM Series Dual-Channel Power Meter
Frequency range of DC: 120 GHz
Wide dynamic range: -70 to +44 dBm
connectivity: Go beyond GPIB with LAN LXI-C & USB
Backward compatible with N1913/14A EPM Series single/dual-channel average power meters
Increased measurement channels: up to four channels with two additional U2000/U8480 Series and U2050/60 (except the peak power measurement) X-Series USB power sensors connected using the optional USB hosts
Automated frequency/power sweep measurements with the optional external trigger in/out feature
KEYSIGHT
Keysight E8663D
Frequency range: 100 kHz~9 GHz
Max. Output power: +15 dBm
Max Phase Noise@1 GHz(20 kHz offset): -143 dBc/Hz
