CIS Testing

CMOS Image Sensor Test System

Overview

Advantages

  • Flexible Test Site Configuration

  • GPU-Based Algorithm Support

  • Multi-Threaded Processing Capability

  • Fast Test Cycle Time

  • Seamless Integration of Customer Algorithms

  • High UPH with Parallel Multi-Site Testing of Up to 32 ICs

  • Offline Tool Support to Minimize Engineering Workload

  • Low Equipment Occupancy Rate

  • Shorter Time-to-Market for New Product Development

Application

  • D PHY 2.5 Gbps
  • C PHY 3.5 Gsps
  • C PHY ,D PHY Combine

  • D-PHY 1.8 Gbps
  • Automotive CIS